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Other articles related with "radiation effect"：
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106103 |
Ning Liu(刘宁), Li-Min Zhang(张利民), Xue-Ting Liu(刘雪婷), Shuo Zhang(张硕), Tie-Shan Wang(王铁山), and Hong-Xia Guo(郭红霞) |
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Lattice damage in InGaN induced by swift heavy ion irradiation |
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Chin. Phys. B
2022 Vol.31 (10): 106103-106103
[Abstract]
(272)
[HTML 0 KB]
[PDF 1242 KB]
(49)
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64211 |
Shen Tan(谭深), Yan Li(李彦), Hao-Shi Zhang(张浩石), Xiao-Wei Wang(王晓伟), and Jing Jin(金靖) |
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Loss prediction of three-level amplified spontaneous emission sources in radiation environment |
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Chin. Phys. B
2022 Vol.31 (6): 64211-064211
[Abstract]
(311)
[HTML 1 KB]
[PDF 954 KB]
(22)
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57102 |
Guo-Dong Xiong(熊国栋), Hui-Ping Zhu(朱慧平), Lei Wang(王磊), Bo Li(李博), Fa-Zhan Zhao(赵发展), and Zheng-Sheng Han(韩郑生) |
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Evolution of optical properties and molecular structure of PCBM films under proton irradiation |
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Chin. Phys. B
2022 Vol.31 (5): 57102-057102
[Abstract]
(302)
[HTML 0 KB]
[PDF 2543 KB]
(50)
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40701 |
Caihong Jia(贾彩红), Min Cao(曹敏), Tingting Ji(冀婷婷), Dawei Jiang(蒋大伟), and Chunxiao Gao(高春晓) |
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Investigating the thermal conductivity of materials by analyzing the temperature distribution in diamond anvils cell under high pressure |
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Chin. Phys. B
2022 Vol.31 (4): 40701-040701
[Abstract]
(440)
[HTML 1 KB]
[PDF 1019 KB]
(41)
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36103 |
Zheng-Zhao Lin(林正兆), Ling Lü(吕玲), Xue-Feng Zheng(郑雪峰), Yan-Rong Cao(曹艳荣), Pei-Pei Hu(胡培培), Xin Fang(房鑫), and Xiao-Hua Ma(马晓华) |
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Effect of heavy ion irradiation on the interface traps of AlGaN/GaN high electron mobility transistors |
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Chin. Phys. B
2022 Vol.31 (3): 36103-036103
[Abstract]
(363)
[HTML 1 KB]
[PDF 1500 KB]
(212)
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56111 |
Shijun Zhao(赵仕俊) |
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Influence of temperature and alloying elements on the threshold displacement energies in concentrated Ni-Fe-Cr alloys |
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Chin. Phys. B
2021 Vol.30 (5): 56111-056111
[Abstract]
(464)
[HTML 1 KB]
[PDF 3382 KB]
(126)
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16103 |
J Assaf |
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Bulk and surface damages in complementary bipolar junction transistors produced by high dose irradiation |
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Chin. Phys. B
2018 Vol.27 (1): 16103-016103
[Abstract]
(548)
[HTML 1 KB]
[PDF 1198 KB]
(237)
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96102 |
Jia-Nan Wei(魏佳男), Hong-Xia Guo(郭红霞), Feng-Qi Zhang(张凤祁), Yin-Hong Luo(罗尹虹), Li-Li Ding(丁李利), Xiao-Yu Pan(潘霄宇), Yang Zhang(张阳), Yu-Hui Liu(刘玉辉) |
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Ionizing radiation effect on single event upset sensitivity of ferroelectric random access memory |
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Chin. Phys. B
2017 Vol.26 (9): 96102-096102
[Abstract]
(667)
[HTML 0 KB]
[PDF 551 KB]
(264)
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86202 |
Li-Ying Tan(谭丽英), Fa-Jun Li(黎发军), Xiao-Long Xie(谢小龙), Yan-Ping Zhou(周彦平), Jing Ma(马晶) |
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Proton radiation effect on GaAs/AlGaAs core-shell ensemble nanowires photo-detector |
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Chin. Phys. B
2017 Vol.26 (8): 86202-086202
[Abstract]
(571)
[HTML 1 KB]
[PDF 439 KB]
(228)
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86201 |
Li-Ying Tan(谭立英), Fa-Jun Li(黎发军), Xiao-Long Xie(谢小龙), Yan-Ping Zhou(周彦平), Jing Ma(马晶) |
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Study on irradiation-induced defects in GaAs/AlGaAs core-shell nanowires via photoluminescence technique |
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Chin. Phys. B
2017 Vol.26 (8): 86201-086201
[Abstract]
(438)
[HTML 1 KB]
[PDF 782 KB]
(272)
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86103 |
Zeng Jian (曾健), Liu Jie (刘杰), Zhang Sheng-Xia (张胜霞), Zhai Peng-Fei (翟鹏飞), Yao Hui-Jun (姚会军), Duan Jing-Lai (段敬来), Guo Hang (郭航), Hou Ming-Dong (侯明东), Sun You-Mei (孙友梅) |
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Irradiation effects of graphene and thin layer graphite induced by swift heavy ions |
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Chin. Phys. B
2015 Vol.24 (8): 86103-086103
[Abstract]
(677)
[HTML 1 KB]
[PDF 1153 KB]
(465)
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14206 |
Jin Jing (金靖), Lin Song (林松), Song Ning-Fang (宋凝芳) |
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Irradiation effect on strain sensitivity coefficient of strain sensing fiber Bragg gratings |
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Chin. Phys. B
2014 Vol.23 (1): 14206-014206
[Abstract]
(602)
[HTML 1 KB]
[PDF 415 KB]
(364)
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104211 |
Liu Chao-Ming (刘超铭), Li Xing-Ji (李兴冀), Geng Hong-Bin (耿洪滨), Rui Er-Ming (芮二明), Guo Li-Xin (郭立新), Yang Jian-Qun (杨剑群) |
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Incident particle range dependence of radiation damage in a power bipolar junction transistor |
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Chin. Phys. B
2012 Vol.21 (10): 104211-104211
[Abstract]
(1047)
[HTML 1 KB]
[PDF 503 KB]
(627)
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80703 |
Liu Chao-Ming (刘超铭), Li Xing-Ji (李兴冀), Geng Hong-Bin (耿洪滨), Yang De-Zhuang (杨德庄), He Shi-Yu (何世禹 ) |
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Effect of bias condition on heavy ion radiation in bipolar junction transistor |
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Chin. Phys. B
2012 Vol.21 (8): 80703-080703
[Abstract]
(1484)
[HTML 1 KB]
[PDF 171 KB]
(702)
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66103 |
Li Xing-Ji(李兴冀), Geng Hong-Bin(耿洪滨), Lan Mu-Jie(兰慕杰), Yang De-Zhuang(杨德庄), He Shi-Yu(何世禹), and Liu Chao-Ming(刘超铭) |
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Degradation mechanisms of current gain in NPN transistors |
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Chin. Phys. B
2010 Vol.19 (6): 66103-066103
[Abstract]
(1537)
[HTML 1 KB]
[PDF 268 KB]
(1911)
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56103 |
Li Xing-Ji(李兴冀), Geng Hong-Bin(耿洪滨), Lan Mu-Jie(兰慕杰), Yang De-Zhuang(杨德庄), He Shi-Yu(何世禹), and Liu Chao-Ming(刘超铭) |
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Radiation effects on MOS and bipolar devices by 8 MeV protons, 60 MeV Br ions and 1 MeV electrons |
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Chin. Phys. B
2010 Vol.19 (5): 56103-056103
[Abstract]
(1212)
[HTML 1 KB]
[PDF 2089 KB]
(1093)
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3760 |
Li Dong-Mei(李冬梅), Wang Zhi-Hua(王志华), Huangfu Li-Ying(皇甫丽英), and Gou Qiu-Jing(勾秋静), |
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Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology |
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Chin. Phys. B
2007 Vol.16 (12): 3760-3765
[Abstract]
(1413)
[HTML 1 KB]
[PDF 991 KB]
(1642)
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792 |
Zhang En-Xia (张恩霞), Qian Cong (钱聪), Zhang Zheng-Xuan (张正选), Lin Cheng-Lu (林成鲁), Wang Xi (王曦), Wang Ying-Min (王英民), Wang Xiao-He(王晓荷), Zhao Gui-Ru (赵桂茹), En Yun-Fei (恩云飞), Luo Hong-Wei (罗宏伟), Shi Qian (师谦) |
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Improvement of total-dose irradiation hardness of silicon-on-insulator materials by modifying the buried oxide layer with ion implantation |
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Chin. Phys. B
2006 Vol.15 (4): 792-797
[Abstract]
(1576)
[HTML 1 KB]
[PDF 325 KB]
(683)
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948 |
Zhang Guo-Qiang (张国强), Guo Qi (郭旗), Erkin (艾尔肯), Lu Wu (陆妩), Ren Di-Yuan (任迪远) |
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A novel technique for predicting ionizing radiation effects of commercial MOS devices |
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Chin. Phys. B
2004 Vol.13 (6): 948-953
[Abstract]
(1103)
[HTML 0 KB]
[PDF 182 KB]
(454)
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